News and Events
Warning: Last items in stock!
HDXRF is an elemental analysis technique which uses XOS’s patented Doubly Curved Crystal (DCC) optics to enhance measurement sensitivity, precision, and accuracy. Multiple optics capture x-rays from a divergent x-ray beam. The optics redirect several select and monochromatic energy beams to focus intensely on the sample. By using focused monochromatic excitation beams in three different energy regions, HDXRF is able to eliminate scattering background and reduce interferences that hinder measurement sensitivity, repeatability, and speed.
|Elements||Hg, Cd, As, Cr, Pb, Sb, Cu, Ni, Se, Ag, Zn, Ba, Tl|
|Analyzer Weight||<6.0 kg (13.2 lbs)|
|Test Stand Dimensions||25.4 cm (w) x 21.8 cm (d) x 37.8 cm (h)|